Description: Das Projekt "Verbesserung von Photovoltaikmodulen - Massnahmen bezueglich der Widerstandsfaehigkeit gegenueber elektrischen und thermischen Einwirkungen, die durch eine Sperrspannung in Zellen hervorgerufen werden" wird vom Umweltbundesamt gefördert und von Technischer Überwachungs-Verein Rheinland Sicherheit und Umweltschutz durchgeführt. Objective: Besides environmental factors, hot-spot heating affects the service lifetime of PV modules. The origin of hot-spot heating lies in the complete or partial shading of cells inside the module. Shaded cells are operated on the reverse current-voltage characteristic, causing energy dissipation in the form of heat. European module manufacturers who rely on purchasing crystalline silicon cells are presently uncertain about suitable hot-spot safety measures (bypass diode concepts) because the reverse operation behaviour of solar cells is not documented. In addition, the hot-spot problem for thin-film photovoltaic modules has not been adequately investigated up to the present. This research project will contribute to improving the module design for the different cell technologies that have achieved production level (c-Si, a-Si, CdS, CdTe). The individual behaviour of commercially available crystalline silicon cells under reverse biased conditions is to be documented so that module manufacturers can use this data base to set up module designs. For large area modules fundamental questions are to be solved regarding the behaviour of serial and parallel cell interconnection concepts in shading conditions. For thin-film modules fundamental questions regarding hot-spot heating effects under realistic shading conditions are to be clarified. Description of work: With regard to the electrical and thermal characterisation of reverse biased crystalline silicon cells a comprehensive test program will be applied to all commercially available cells. Batches of the cell types will be subjected to the measurement of reverse current-voltage characteristics, infrared imaging and junction breakdown measurement and hot-spot safety measures will be derived which are suitable for the individual cell types. A test program will be carried out to document hot-spot heating effects for different serial/parallel cell interconnection circuits, leading to better design for large-area modules. Studies will be conducted on the financial risks for manufacturers of large-area modules in the event that hot-spot safety measures are omitted and location specific shading can be excluded. The cost savings in production will be compared to possible follow-up costs which arise as a result of the hot-spot damage of modules. Indoor and outdoor hot-spot tests will be performed for commercial thin-film modules under realistic shading conditions. Based on these results, a new measurement principle for hot-spot testing will be developed that will be suitable as a replacement for the current principle laid down in IEC standards. Exploitation of results will be achieved through publications, Internet presentation and the organisation of a workshop for European module manufacturers. Expected Results and Exploitation Plans: Preparation of a comprehensive database for the reverse biased operation of cells of crystalline silicon and thin-film technology...
Types:
SupportProgram
Origin: /Bund/UBA/UFORDAT
Tags: Rheinland ? Silikon ? Photovoltaikanlage ? Cadmiumtellurid ? Elektronik ? Silizium ? Solarenergie ? Solarzelle ? Thermodynamik ? Wärmebelastung ? Anlagenoptimierung ? Stromerzeugung ? Energieverschwendung ? Kostenrechnung ? Umweltschutzmaßnahme ? Forschungsprojekt ? Energieeinsparung ? Energiegewinnung ? Energietechnik ? Folgekosten ? Messverfahren ? Modul ? Risikoanalyse ? Studie ? Technikfolgenabschätzung ? Umwelttechnik ? Wirtschaftlichkeit ? Produktdesign ? Ökologischer Faktor ? Risiko ? Sicherheitsmaßnahme ? Umweltschutz ? Heizung ? Anlagenbau ? Datenbank ? Workshop ? Temperaturerhöhung ? CdS ? c-Si ? renewable sources of energy ? a-Si ?
Region: Nordrhein-Westfalen
Bounding box: 6.76339° .. 6.76339° x 51.21895° .. 51.21895°
License: cc-by-nc-nd/4.0
Language: Deutsch
Time ranges: 2000-11-01 - 2002-10-01
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